Khan, R. S. Et Al. 2019. Exploiting Lithography Limits for Hardware Security Applications. The 19th IEEE International Conferenceon Nanotechnology IEEE-NANO 2019 , (Macau SAR, China), 9-12.

Khan, R. S., Noor, N., Jin, C., Muneer, S., DİRİSAĞLIK, F., Cywar, A., ... Nguyen, P. H.(2019). Exploiting Lithography Limits for Hardware Security Applications . The 19th IEEE International Conferenceon Nanotechnology IEEE-NANO 2019 (pp.9-12). Macau SAR, China

Khan, Raihan Et Al. "Exploiting Lithography Limits for Hardware Security Applications," The 19th IEEE International Conferenceon Nanotechnology IEEE-NANO 2019, Macau SAR, China, 2019

Khan, Raihan S. Et Al. "Exploiting Lithography Limits for Hardware Security Applications." The 19th IEEE International Conferenceon Nanotechnology IEEE-NANO 2019 , Macau SAR, China, pp.9-12, 2019

Khan, R. S. Et Al. (2019) . "Exploiting Lithography Limits for Hardware Security Applications." The 19th IEEE International Conferenceon Nanotechnology IEEE-NANO 2019 , Macau SAR, China, pp.9-12.

@conferencepaper{conferencepaper, author={Raihan Sayeed Khan Et Al. }, title={Exploiting Lithography Limits for Hardware Security Applications}, congress name={The 19th IEEE International Conferenceon Nanotechnology IEEE-NANO 2019}, city={Macau SAR}, country={China}, year={2019}, pages={9-12} }