PAT, S. Et Al. 2015. Characterization of BaF2 Thin Film Deposited by Thermionic Vacuum Arc. JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS , vol.10, no.3 , 301-303.

PAT, S., Cetin, N. E., Korkmaz, S., Balbag, M. Z., & Ekem, N., (2015). Characterization of BaF2 Thin Film Deposited by Thermionic Vacuum Arc. JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS , vol.10, no.3, 301-303.

PAT, SUAT Et Al. "Characterization of BaF2 Thin Film Deposited by Thermionic Vacuum Arc," JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS , vol.10, no.3, 301-303, 2015

PAT, SUAT Et Al. "Characterization of BaF2 Thin Film Deposited by Thermionic Vacuum Arc." JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS , vol.10, no.3, pp.301-303, 2015

PAT, S. Et Al. (2015) . "Characterization of BaF2 Thin Film Deposited by Thermionic Vacuum Arc." JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS , vol.10, no.3, pp.301-303.

@article{article, author={SUAT PAT Et Al. }, title={Characterization of BaF2 Thin Film Deposited by Thermionic Vacuum Arc}, journal={JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS}, year=2015, pages={301-303} }