Elmas, S. Et Al. 2019. Investigation of physical properties and surface free energy of produced ITO thin films by TVA technique. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.30, no.9 , 8876-8882.

Elmas, S., KORKMAZ, Ş., & PAT, S., (2019). Investigation of physical properties and surface free energy of produced ITO thin films by TVA technique. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.30, no.9, 8876-8882.

Elmas, Saliha, ŞADAN KORKMAZ, And SUAT PAT. "Investigation of physical properties and surface free energy of produced ITO thin films by TVA technique," JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.30, no.9, 8876-8882, 2019

Elmas, Saliha Et Al. "Investigation of physical properties and surface free energy of produced ITO thin films by TVA technique." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.30, no.9, pp.8876-8882, 2019

Elmas, S. KORKMAZ, Ş. And PAT, S. (2019) . "Investigation of physical properties and surface free energy of produced ITO thin films by TVA technique." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.30, no.9, pp.8876-8882.

@article{article, author={Saliha Elmas Et Al. }, title={Investigation of physical properties and surface free energy of produced ITO thin films by TVA technique}, journal={JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS}, year=2019, pages={8876-8882} }