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Cetiner, G., YAYAN, U., & YAZICI, A., (2024). Mutation Based White Box Testing of Deep Neural Networks. IEEE Access .
Cetiner, Gokhan, UĞUR YAYAN, And AHMET YAZICI. "Mutation Based White Box Testing of Deep Neural Networks," IEEE Access , 2024
Cetiner, Gokhan Et Al. "Mutation Based White Box Testing of Deep Neural Networks." IEEE Access , 2024
Cetiner, G. YAYAN, U. And YAZICI, A. (2024) . "Mutation Based White Box Testing of Deep Neural Networks." IEEE Access .
@article{article, author={Gokhan Cetiner Et Al. }, title={Mutation Based White Box Testing of Deep Neural Networks}, journal={IEEE Access}, year=2024}