Cetiner, G. Et Al. 2024. Mutation Based White Box Testing of Deep Neural Networks. IEEE Access , vol.12 , 160156-160174.

Cetiner, G., YAYAN, U., & YAZICI, A., (2024). Mutation Based White Box Testing of Deep Neural Networks. IEEE Access , vol.12, 160156-160174.

Cetiner, Gokhan, UĞUR YAYAN, And AHMET YAZICI. "Mutation Based White Box Testing of Deep Neural Networks," IEEE Access , vol.12, 160156-160174, 2024

Cetiner, Gokhan Et Al. "Mutation Based White Box Testing of Deep Neural Networks." IEEE Access , vol.12, pp.160156-160174, 2024

Cetiner, G. YAYAN, U. And YAZICI, A. (2024) . "Mutation Based White Box Testing of Deep Neural Networks." IEEE Access , vol.12, pp.160156-160174.

@article{article, author={Gokhan Cetiner Et Al. }, title={Mutation Based White Box Testing of Deep Neural Networks}, journal={IEEE Access}, year=2024, pages={160156-160174} }