T. Kamas Et Al. , "Thickness mode EMIS of constrained proof-mass piezoelectric wafer active sensors," SMART MATERIALS AND STRUCTURES , vol.24, no.11, 2015
Kamas, T. Et Al. 2015. Thickness mode EMIS of constrained proof-mass piezoelectric wafer active sensors. SMART MATERIALS AND STRUCTURES , vol.24, no.11 .
Kamas, T., Giurgiutiu, V., & Lin, B., (2015). Thickness mode EMIS of constrained proof-mass piezoelectric wafer active sensors. SMART MATERIALS AND STRUCTURES , vol.24, no.11.
Kamas, Tuncay, Victor Giurgiutiu, And Bin Lin. "Thickness mode EMIS of constrained proof-mass piezoelectric wafer active sensors," SMART MATERIALS AND STRUCTURES , vol.24, no.11, 2015
Kamas, Tuncay Et Al. "Thickness mode EMIS of constrained proof-mass piezoelectric wafer active sensors." SMART MATERIALS AND STRUCTURES , vol.24, no.11, 2015
Kamas, T. Giurgiutiu, V. And Lin, B. (2015) . "Thickness mode EMIS of constrained proof-mass piezoelectric wafer active sensors." SMART MATERIALS AND STRUCTURES , vol.24, no.11.
@article{article, author={Tuncay Kamas Et Al. }, title={Thickness mode EMIS of constrained proof-mass piezoelectric wafer active sensors}, journal={SMART MATERIALS AND STRUCTURES}, year=2015}