Ozen, S. Et Al. 2015. Characterization of a fast grown GaAs:Sn thin film by thermionic vacuum arc. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.26, no.11 , 8983-8987.

Ozen, S., Senay, V., PAT, S., & KORKMAZ, Ş., (2015). Characterization of a fast grown GaAs:Sn thin film by thermionic vacuum arc. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.26, no.11, 8983-8987.

Ozen, Soner Et Al. "Characterization of a fast grown GaAs:Sn thin film by thermionic vacuum arc," JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.26, no.11, 8983-8987, 2015

Ozen, Soner Et Al. "Characterization of a fast grown GaAs:Sn thin film by thermionic vacuum arc." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.26, no.11, pp.8983-8987, 2015

Ozen, S. Et Al. (2015) . "Characterization of a fast grown GaAs:Sn thin film by thermionic vacuum arc." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.26, no.11, pp.8983-8987.

@article{article, author={Soner Ozen Et Al. }, title={Characterization of a fast grown GaAs:Sn thin film by thermionic vacuum arc}, journal={JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS}, year=2015, pages={8983-8987} }