Adnane, L. Et Al. 2016. Characterization of Seebeck Coefficient and Electrical Resistivity of Ge2Sb2Te5 Thin Films. International Semiconductor Device Research Symposium (ISDRS) 2016 , (United States Of America).

Adnane, L., DİRİSAĞLIK, F., ÇİL, K., Cywar, A., Zhu, Y., Lam, C., ... Gokirmak, A.(2016). Characterization of Seebeck Coefficient and Electrical Resistivity of Ge2Sb2Te5 Thin Films . International Semiconductor Device Research Symposium (ISDRS) 2016, United States Of America

Adnane, Lhacene Et Al. "Characterization of Seebeck Coefficient and Electrical Resistivity of Ge2Sb2Te5 Thin Films," International Semiconductor Device Research Symposium (ISDRS) 2016, United States Of America, 2016

Adnane, Lhacene Et Al. "Characterization of Seebeck Coefficient and Electrical Resistivity of Ge2Sb2Te5 Thin Films." International Semiconductor Device Research Symposium (ISDRS) 2016 , United States Of America, 2016

Adnane, L. Et Al. (2016) . "Characterization of Seebeck Coefficient and Electrical Resistivity of Ge2Sb2Te5 Thin Films." International Semiconductor Device Research Symposium (ISDRS) 2016 , United States Of America.

@conferencepaper{conferencepaper, author={Lhacene Adnane Et Al. }, title={Characterization of Seebeck Coefficient and Electrical Resistivity of Ge2Sb2Te5 Thin Films}, congress name={International Semiconductor Device Research Symposium (ISDRS) 2016}, city={}, country={United States Of America}, year={2016}}