Khan, R. S. Et Al. 2016. A Study on Stochasticity in Hexagonal Close Packed Ge2Sb2Te5 Nanowires. International Semiconductor Device Research Symposium (ISDRS) 2016 , (Bethesda, United States Of America).

Khan, R. S., Noor, N., Ciardullo, A., Muneer, S., Adnane, L., DİRİSAĞLIK, F., ... Cywar, A.(2016). A Study on Stochasticity in Hexagonal Close Packed Ge2Sb2Te5 Nanowires . International Semiconductor Device Research Symposium (ISDRS) 2016, Bethesda, United States Of America

Khan, Raihan Et Al. "A Study on Stochasticity in Hexagonal Close Packed Ge2Sb2Te5 Nanowires," International Semiconductor Device Research Symposium (ISDRS) 2016, Bethesda, United States Of America, 2016

Khan, Raihan S. Et Al. "A Study on Stochasticity in Hexagonal Close Packed Ge2Sb2Te5 Nanowires." International Semiconductor Device Research Symposium (ISDRS) 2016 , Bethesda, United States Of America, 2016

Khan, R. S. Et Al. (2016) . "A Study on Stochasticity in Hexagonal Close Packed Ge2Sb2Te5 Nanowires." International Semiconductor Device Research Symposium (ISDRS) 2016 , Bethesda, United States Of America.

@conferencepaper{conferencepaper, author={Raihan Sayeed Khan Et Al. }, title={A Study on Stochasticity in Hexagonal Close Packed Ge2Sb2Te5 Nanowires}, congress name={International Semiconductor Device Research Symposium (ISDRS) 2016}, city={Bethesda}, country={United States Of America}, year={2016}}