Research Information System
Akan T. (Executive), Durmuş Ç.
Project Supported by Higher Education Institutions, 2021 - 2022
In molar percent, 75TeO2-25ZnO and 70TeO2-30ZnO (TZ) glasses were synthesized using the conventional melt annealing method. The synthesized TZ glasses were deposited as a thin film on microscope glasses using the Thermionic Vacuum Arc (TVA) system. The structure of the deposited TZ thin films and the properties of the synthesized TZ bulk glass samples were examined and compared. Structural properties of deposited TZ thin films and synthesized bulk TZ glass samples were determined using X-ray diffraction (XRD) analysis, Raman spectroscopy and Fourier Transform Infrared Spectroscopy (FT-IR). Morphological properties of TZ thin films were obtained using field emission scanning electron microscopy (FE-SEM) images and atomic force microscopy (AFM). Finally, the structure and optical properties of synthesized TZ bulk glass samples were obtained by ultraviolet visible spectrophotometer (UV-VIS) in the 350-1000 nm range. Deposited TZ thin film samples did not show transmittance in UV-VIS analysis. XRD and Raman analysis showed that TZ thin films have an amorphous structure similar to synthesized TZ bulk glasses with limited crystallization. The results show homogeneous and amorphous TZ thin film structures with few polycrystalline formations. From the Tauc plots, the band gap for the synthesized 75TeO2-25ZnO bulk glass was found to be 2.31 to 2.90 eV by direct transition calculations, 2.35 to 2.77eV for the synthesized 70TeO2-30ZnO bulk glass, and 2.07 to 2.90 eV for the synthesized 75TeO2-25ZnO bulk glass and 1.98 to 2.45 eV for the synthesized 70TeO2-30ZnO bulk glass by indirect transition calculations.
Keywords: Plasma, TVA, TeO2-ZnO, Glassy structures