TeO2–ZnO (tellurium oxide – Zinc oxide) thin film deposition by the thermionic vacuum arc plasma
PHYSICA B: CONDENSED MATTER, cilt.654, sa.414694, ss.1-8, 2023 (SCI-Expanded, Scopus)
- Yayın Türü: Makale / Tam Makale
- Cilt numarası: 654 Sayı: 414694
- Basım Tarihi: 2023
- Doi Numarası: 10.1016/j.physb.2023.414694
- Dergi Adı: PHYSICA B: CONDENSED MATTER
- Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Academic Search Premier, PASCAL, Aerospace Database, Chemical Abstracts Core, Communication Abstracts, INSPEC, Metadex, Civil Engineering Abstracts
- Sayfa Sayıları: ss.1-8
- Eskişehir Osmangazi Üniversitesi Adresli: Evet
Özet
In this study, 75TeO2–25ZnO and 70TeO2–30ZnO (mol %) (TZ) glasses were synthesized by using a traditional
melt-quenching method. The synthesized TZ glasses were deposited as a thin film using the thermionic vacuum
arc (TVA) system. The structure of the deposited TZ thin films and the synthesized TZ bulk glass samples were
compared. The structural properties of the TZ thin films and bulk glass samples were determined by using X-ray
diffraction (XRD) analysis, Raman spectroscopy, and Fourier Transform Infrared Spectroscopy (FT-IR). The
morphological properties of the TZ thin films were obtained by using field emission scanning electron microscopy (FE-SEM) images and atomic force microscopy (AFM). The optical properties of bulk glass samples are
obtained with ultraviolet–visible spectrophotometry in the range of 350–1000 nm. Lastly, the electrical properties were obtained by using dielectric spectroscopy. XRD and Raman analysis showed that the TZ thin films had
an amorphous structure similar to the synthesized bulk glasses with limited crystallization. The results show
homogenous and amorphous thin film structures with few polycrystalline formations.