The effect of annealing temperature on the structural and electrical properties of ultrasonically sprayed cadmium oxide films

AKYÜZ İ., Kose S., Atay F., Bilgin V.

JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, cilt.9, sa.12, ss.3812-3815, 2007 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 9 Sayı: 12
  • Basım Tarihi: 2007
  • Dergi Adı: JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.3812-3815
  • Anahtar Kelimeler: A.oxides A.thin films C.x-ray diffraction D.crystal structure D.electrical properties, THIN-FILMS, OPTICAL-PROPERTIES, CDO FILMS
  • Eskişehir Osmangazi Üniversitesi Adresli: Evet

Özet

In this work, the effect of the thermal annealing on the structural and electrical properties of CdO films obtained by ultrasonic spray pyrolysis technique was studied. Samples were annealed at 250, 350 and 450 degrees C. X-ray diffraction patterns were taken, and texture coefficient (P), grain size (D) and dislocation density (8) were calculated to explain the structural variations. Van der Pauw and Hall measurements were made, and electical resistivity and mobility values were calculated. It was determined from all investigations that the films had better structural and electrical characteristics after annealing processes.