A New Approach for Nanoindentation Using Multiprobe AFM System


ÇİNAR E. , Sahin F., Yablon D.

2014 IEEE 14TH INTERNATIONAL CONFERENCE ON NANOTECHNOLOGY (IEEE-NANO), Toronto, Canada, 14 - 21 August 2014, pp.49-53

  • Publication Type: Conference Paper / Full Text
  • City: Toronto
  • Country: Canada
  • Page Numbers: pp.49-53