Ensemble learning application for textile defect detection

Guder O., Isik S., Anagün Y.

International Journal of Applied Methods in Electronics and Computers, vol.11, no.3, pp.145-150, 2023 (Peer-Reviewed Journal)

• Publication Type: Article / Article
• Volume: 11 Issue: 3
• Publication Date: 2023
• Doi Number: 10.58190/ijamec.2023.41
• Journal Name: International Journal of Applied Methods in Electronics and Computers
• Journal Indexes: Index Copernicus, Sobiad Atıf Dizini
• Page Numbers: pp.145-150
• Eskisehir Osmangazi University Affiliated: Yes