Diffraction by a thick impedance half-plane with a different end face impedance

Cinar G., Buyukaksoy A.

ELECTROMAGNETICS, vol.22, no.7, pp.565-580, 2002 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 22 Issue: 7
  • Publication Date: 2002
  • Doi Number: 10.1080/02726340290084120
  • Journal Name: ELECTROMAGNETICS
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.565-580
  • Keywords: diffraction, thick half-plane, Wiener-Hopf technique
  • Eskisehir Osmangazi University Affiliated: No

Abstract

Plane wave diffraction by a thick impedance half-plane with a different end face impedance is investigated rigorously by using the Fourier transform technique. The related boundary-value problem is formulated as a modified Wiener-Hopf equation whose solution requires the determination of a set of infinitely many expansion coefficients which satisfy an infinite linear system of algebraic equations. This system is solved numerically. The effect of the width and the characteristic impedances on different faces of the thick half-plane are presented graphically.