JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, vol.9, no.12, pp.3812-3815, 2007 (SCI-Expanded)
In this work, the effect of the thermal annealing on the structural and electrical properties of CdO films obtained by ultrasonic spray pyrolysis technique was studied. Samples were annealed at 250, 350 and 450 degrees C. X-ray diffraction patterns were taken, and texture coefficient (P), grain size (D) and dislocation density (8) were calculated to explain the structural variations. Van der Pauw and Hall measurements were made, and electical resistivity and mobility values were calculated. It was determined from all investigations that the films had better structural and electrical characteristics after annealing processes.