Optical and electric properties of Fe3O4 nanoparticle doped ZnO thin films


Ozer Z. N., Ozkan M., PAT S.

Ceramics International, cilt.50, sa.13, ss.22696-22703, 2024 (SCI-Expanded) identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 50 Sayı: 13
  • Basım Tarihi: 2024
  • Doi Numarası: 10.1016/j.ceramint.2024.03.371
  • Dergi Adı: Ceramics International
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Academic Search Premier, Aerospace Database, Chemical Abstracts Core, Communication Abstracts, Compendex, INSPEC, Metadex, Civil Engineering Abstracts
  • Sayfa Sayıları: ss.22696-22703
  • Anahtar Kelimeler: FeNPs, Resistance, Surface properties, TCO, ZnO
  • Eskişehir Osmangazi Üniversitesi Adresli: Evet

Özet

In this study, ZnO thin films were doped with Fe3O4 nanoparticles to investigate the impact of particle size on optical properties. Generally, the size of doped materials is ignored in thin film synthesis. However, it plays a significant role in determining certain physical properties. After doping Fe3O4 nanoparticles into ZnO, we present the morphology and structure of the doped ZnO thin films prepared using the thermionic vacuum arc (TVA) method. In addition, the effects of nanoparticles and substrates were investigated. Fe3O4 nanoparticles were synthesized using the solution plasma process. According to the x-ray diffraction analyses, the reflection planes of Fe3O4 and Fe24O32 have been determined. The crystallite size is approximately 600 nm, as determined by the Scherrer equation. The Fe/Zn ratios were measured as 52/48 and 3/97 for the film deposited onto uncoated and ITO-coated glass substrates, respectively. In the optical results, the band gap of the two-dimensional FeO nanoparticles was observed to be 2.4 eV. For ZnO, the band gap was calculated as 3.3 eV using the optical method. The height distributions of the grains were measured at 5 nm for uncoated glass samples and 2 nm for ITO-coated glass samples. As a result, the diameters of doped materials can play a critical role in the optical and crystallographic structures of the deposited thin films.