Optical properties of Nb2O5 doped ZnO nanocomposite thin film deposited by thermionic vacuum arc


PAT S., ÇELİK Ö., ODABAŞ A., KORKMAZ Ş.

Optik, cilt.258, 2022 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 258
  • Basım Tarihi: 2022
  • Doi Numarası: 10.1016/j.ijleo.2022.168928
  • Dergi Adı: Optik
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Academic Search Premier, Aerospace Database, Communication Abstracts, Compendex, INSPEC
  • Anahtar Kelimeler: ZnO, Band gap, Artificial intelligence, Thermionic vacuum arc, PHYSICAL-PROPERTIES, BAND-GAP, ENERGY, NB, FABRICATION, SMOTE
  • Eskişehir Osmangazi Üniversitesi Adresli: Evet

Özet

© 2022 Elsevier GmbHIn this study, Nb2O5: ZnO nanocomposite thin film has been deposited by thermionic vacuum arc and then surface and optical properties of Nb2O5: ZnO nanocomposite thin film have been investigated. The surface and optical properties were investigated by a scanning electron microscopy and atomic force microscopy. Optical properties and band gap value were determined by UV-Vis spectrophotometer. Thickness of the film was determined as 25 nm. Weight percentages of Zn and Nb elements were found as 99.85% and 0.15%, respectively. Deposited thin films were transparent. Artificial intelligence (AI) technique is a promising and an alternative technique for research and development to determine the properties of a material. For this aim, optical band gap predictions were done. The band gap energy value was calculated 3.08 eV. The band gaps of 3.39 eV and 3.62 eV were estimated by Gaussian processes regression and Gaussian processes regression with synthetic minority over-sampling technology model, respectively. Estimated band gap value is close to the estimated value from the Tauc model. It is acceptable for the determination. But, crystal diameter and atom number values were nearly the same as experimental and predicted values. As a result, AI techniques are useful techniques for the determination of the film properties.