Some physical properties of In doped copper oxide films produced by ultrasonic spray pyrolysis

Kose S., Ketenci E., Bilgin V., Atay F., AKYÜZ İ.

CURRENT APPLIED PHYSICS, cilt.12, sa.3, ss.890-895, 2012 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 12 Sayı: 3
  • Basım Tarihi: 2012
  • Doi Numarası: 10.1016/j.cap.2011.12.004
  • Dergi Adı: CURRENT APPLIED PHYSICS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.890-895
  • Anahtar Kelimeler: Ultrasonic spray pyrolysis, CuO:In, Spectroscopic ellipsometry, X-ray diffraction, AFM, CHEMICAL-VAPOR-DEPOSITION, THIN-FILMS, CUO, CU2O, GROWTH, OXYGEN
  • Eskişehir Osmangazi Üniversitesi Adresli: Evet

Özet

In this work, we have reported the effect of In doping on structural, optical and surface properties of copper oxide films obtained by a low-cost ultrasonic spray pyrolysis technique. Thicknesses, refractive indices and extinction coefficients of the films have been determined by Spectroscopic ellipsometry technique using Cauchy-Urbach model for fitting. A very good agreement was found between experimental and theoretical parameters with low MSE values. Transmission and reflectance spectra have been taken by UV Spectrophotometer, and band gap values have been determined by optical method. Structural properties of the films were investigated with X-ray diffraction patterns. In doping caused the films to growth through some certain directions. Atomic force microscope images have been taken to see the effect of In doping on surface topography and roughness of copper oxide films. Surface properties of undoped films have been improved by In doping. Lowest roughness values have been obtained for In doping at 1%. As a result, we have concluded that properties of copper oxide films which are commonly used in solar cells may have improved by In doping (especially In doped at 1%). (C) 2011 Elsevier B.V. All rights reserved.