Pulse-mode Electrical Resistance Trimming of Ge2Sb2Te5 Phase Change Memory (PCM) Line Cells

Noor N., Muneer S., Adnane L., Khan R. S. , Ramadan R., DİRİSAĞLIK F. , ...More

International Semiconductor Device Research Symposium (ISDRS) 2016, Bethesda, United States Of America, 7 - 09 December 2016

  • Publication Type: Conference Paper / Summary Text
  • City: Bethesda
  • Country: United States Of America