Characterization of Seebeck Coefficient and Electrical Resistivity of Ge2Sb2Te5 Thin Films


Adnane L., DİRİSAĞLIK F. , ÇİL K., Cywar A., Zhu Y., Lam C., ...More

International Semiconductor Device Research Symposium (ISDRS) 2016, United States Of America, 7 - 09 December 2016

  • Publication Type: Conference Paper / Summary Text
  • Country: United States Of America