SCI, SSCI ve AHCI İndekslerine Giren Dergilerde Yayınlanan Makaleler
Deep Discriminative Feature Models (DDFMs) for Set Based Face Recognition and Distance Metric Learning
IEEE Transactions on Pattern Analysis and Machine Intelligence
, cilt.45, sa.5, ss.5594-5608, 2023 (SCI-Expanded)
Hakemli Kongre / Sempozyum Bildiri Kitaplarında Yer Alan Yayınlar
Semi-Supervised Robust Deep Neural Networks for Multi-Label Classification
IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 16 - 20 Haziran 2019